Thin Film Oven

Thin Film Oven

Product Details:

  • Mounting Type Floor-mounted
  • Temperature Ambient to 200C
  • Application Testing thin film properties
  • Specimen Size Standard size as per ASTM D2872
  • Measuring Range Ambient to 200C
  • Number of Specimens 4
  • Features Uniform heating easy specimen mounting
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Thin Film Oven Product Specifications

  • Digital PID Control
  • Thin film aging test
  • Approx. 35 kg
  • Ambient to 200C
  • Floor-mounted
  • Manual Control
  • 0.1C
  • Fast heating response
  • Uniform heating easy specimen mounting
  • Standard-sized door
  • Up to 4 specimens
  • 4
  • Electric
  • Evaluating the aging properties of thin films
  • Ambient to 200C
  • 0.5C
  • LED Display
  • Standard size as per ASTM D2872
  • 220V AC Single Phase
  • Testing thin film properties

Product Description



The Thin Film Oven is designed for testing thin films as per ASTM D2872 standards. With a floor-mounted structure, it features a manual control interface and a digital PID control mode for accurate testing. The LED display showcases a resolution of 0.1C, offering a measuring range from ambient to 200C with an accuracy of 0.5C. This oven can accommodate up to 4 specimens, providing uniform heating and fast response time. Suitable for evaluating the aging properties of thin films, it is electrically powered and weighs approximately 35 kg. The standard-sized door and easy specimen mounting make it a practical choice for various applications.

FAQs of Thin Film Oven:


Q: What is the capacity of the Thin Film Oven?

A: The Thin Film Oven can accommodate up to 4 specimens for testing.

Q: What is the testing range of the oven?

A: The oven offers a testing range from ambient temperature to 200C.

Q: What is the control mode of the Thin Film Oven?

A: The oven operates on a digital PID control mode for precise testing.

Q: What is the resolution of the LED display?

A: The LED display on the oven has a resolution of 0.1C.

Q: What is the application of the Thin Film Oven?

A: The Thin Film Oven is used for evaluating the aging properties of thin films.

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